Abstract
Bending modulus of exfoliation-made single-crystalline hexagonal boron nitride nanosheets (BNNSs) with thicknesses of 25-300nm and sizes of 1.2-3.0 νm were measured using three-point bending tests in an atomic force microscope. BNNSs suspended on an SiO2 trench were clamped by a metal film via microfabrication based on electron beam lithography. Calculated by the plate theory of a doubly clamped plate under a concentrated load, the bending modulus of BNNSs was found to increase with the decrease of sheet thickness and approach the theoretical C33 value of a hexagonal BN single crystal in thinner sheets (thickness<50nm). The thickness-dependent bending modulus was suggested to be due to the layer distribution of stacking faults which were also thought to be responsible for the layer-by-layer BNNS exfoliation. © 2009 IOP Publishing Ltd.
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CITATION STYLE
Li, C., Bando, Y., Zhi, C., Huang, Y., & Golberg, D. (2009). Thickness-dependent bending modulus of hexagonal boron nitride nanosheets. Nanotechnology, 20(38). https://doi.org/10.1088/0957-4484/20/38/385707
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