High-mobility low-voltage ZnO and Li-doped ZnO transistors based on ZrO2 high-k dielectric grown by spray pyrolysis in ambient air

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Abstract

Sequential layers of the high-k dielectric ZrO2 and the electron transporting semiconductors ZnO and Li-doped ZnO are deposited onto conductive indium tin oxide electrodes using spray pyrolysis. With these structures, thin-film transistors are fabricated with operating voltages below 6 V and maximum electron mobilities on the order of 85 cm2 V-1 s-1. © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

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Adamopoulos, G., Thomas, S., Wöbkenberg, P. H., Bradley, D. D. C., McLachlan, M. A., & Anthopoulos, T. D. (2011). High-mobility low-voltage ZnO and Li-doped ZnO transistors based on ZrO2 high-k dielectric grown by spray pyrolysis in ambient air. Advanced Materials, 23(16), 1894–1898. https://doi.org/10.1002/adma.201003935

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