Lifetime Yield Optimization of Analog Circuits Considering Process Variations and Parameter Degradations

  • Pan X
  • Graeb H
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Abstract

This book highlights key design issues and challenges to guarantee the development of successful applications of analog circuits. Researchers around the world share acquired experience and insights to develop advances in analog circuit design, modeling and simulation. The key contributions of the sixteen chapters focus on recent advances in analog circuits to accomplish academic or industrial target specifications. BT - Advances in Analog Circuits

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APA

Pan, X., & Graeb, H. (2011). Lifetime Yield Optimization of Analog Circuits Considering Process Variations and Parameter Degradations. In Advances in Analog Circuits. InTech. https://doi.org/10.5772/14322

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