Abstract
The paper reports the experimental validation of a new Bulk Built-In Current Sensor (BBICS) designed and implemented in a 40nm CMOS technology. The double-access architecture provides improved SEE detection as confirmed by laser experiments.
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CITATION STYLE
Champeix, C., Dutertre, J. M., Pouget, V., Robisson, B., Lisart, M., Borrel, N., & Sarafianos, A. (2017). Laser testing of a double-access BBICS architecture with improved SEE detection capabilities. In Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS (Vol. 2016-September, pp. 1–4). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/RADECS.2016.8093172
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