Journal ArticleOPEN ACCESS

Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials

  • Findlay S
  • Shibata N
  • Ikuhara Y
  • et al.
Microscopy Today (2017) 25(6) 36-41
DOI: 10.1017/s1551929517001006
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Findlay, S. D., Shibata, N., Ikuhara, Y., Huang, R., Okunishi, E., Sawada, H., … Kondo, Y. (2017). Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials. Microscopy Today, 25(6), 36–41. https://doi.org/10.1017/s1551929517001006

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