High-resolution low-dose scanning transmission electron microscopy

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Abstract

During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electron dose for high-resolution imaging. We describe here protocols for low-dose STEM image recording with a conventional field-emission gun STEM, while maintaining the high-resolution capability of the instrument. Our findings show that a combination of reduced pixel dwell time and reduced gun current can achieve radiation doses comparable to low-dose TEM. © 2009 The Author.

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Buban, J. P., Ramasse, Q., Gipson, B., Browning, N. D., & Stahlberg, H. (2010). High-resolution low-dose scanning transmission electron microscopy. Journal of Electron Microscopy, 59(2), 103–112. https://doi.org/10.1093/jmicro/dfp052

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