Abstract
BiFeO3 thin films were grown by chemical solution deposition using precursors with different elemental ratios, Bi/Fe = 1.1/1.0, 1.0/1.0 and 1.0/1.1. All the samples consisted of two easily distinguishable components of crystalline and amorphous phases. We have found that the electric properties of BiFeO3 thin films are closely connected to the crystallinity of the films.
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CITATION STYLE
Nakamura, T., Fukumura, H., Hasuike, N., Harima, H., Nakamura, Y., Kisoda, K., … Okuyama, M. (2009). Micro-Raman study of BiFeO3 thin films fabricated by chemical solution deposition using different Bi/Fe ratio precursors. Acta Physica Polonica A, 116(1), 72–74. https://doi.org/10.12693/APhysPolA.116.72
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