Sub microsecond notching of a negative hydrogen beam at low energy utilizing a magnetron ion source with a split extractor

Abstract

A technique for sub-microsecond beam notching is being developed at 20 keV utilizing a Magnetron ion source with a slit extraction system and a split extractor. Each half of the extractor is treated as part of a 50 ohm transmission line which can be pulsed at ±700 volts creating a 1400 volt gradient. This system along with the associated electronics is electrically floated on top of a pulsed extraction voltage. A beam reduction of 95% has been observed at the end of the Fermilab 400 MeV Linac and 35% notching has recently been achieved in the Booster. © 2005 American Institute of Physics.