Use of Active, Collaborative and Problem based Learning Strategies in the Digital Circuits Course of Electronics and Communication Engineering

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Abstract

The two well notable constraints faced by the engineering instructors are sustaining learner engagement and motivation. This paper inspects the potential usage of active, problem based and collaborative learning strategies in the digital circuits course of electronics and communication engineering department at Anurag University where in a class there will be wide diversified students coming from rural & urban areas, different medium of study in school education, different thinking & grasping abilities. Despite many researchers substantiated that different learning strategies are conducive in enriching learning momentum, motivating learners, improved skills of applying the knowledge gained to perform a specific task/application, making the learners feel the sense of purpose, relevancy to learning, enriched individual and team accountability, there is a need to develop exceptional techniques for the learners with different backgrounds. The various strategies that are implemented for this course of learners includes Concept Mapping Test (CMT), Think-Pair-Share (TPS) as a part of active learning, Simulation based Test (ST), Model Design (MD) as a part of problem based learning, Jigsaw & Problem Solving through Group Discussion (PSGD) as a part of collaborative learning. The detailed course of plan, execution & reflection report of each strategy is mentioned in the paper. Results showed that these approaches are found to be very effective in resolving the afore said constraints enriching the learning spirit among the students and improvement in regularity of attending classes by learners.

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APA

Reddy, P. L., Gouri, N. M., Singh, D. N., & Pulluri, H. (2025). Use of Active, Collaborative and Problem based Learning Strategies in the Digital Circuits Course of Electronics and Communication Engineering. Journal of Engineering Education Transformations, 38(Special Issue), 77–84. https://doi.org/10.16920/jeet/2025/v38is2/25010

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