Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
CITATION STYLE
Salge, T., Boehm, S., Pauwels, B., Sasov, A., & Alba-Tercedor, J. (2013). Advances in X-ray Microtomography in SEM with Submicron Spatial Resolution: Applications in Life, Earth and Material Sciences. Microscopy and Microanalysis, 19(S2), 622–623. https://doi.org/10.1017/s1431927613005102
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