Characterization of X-ray area detectors for synchrotron beamlines

Abstract

In order to deal with the problem of quantitative and consistent evaluation of two-dimensional X-ray detectors at synchrotron beamlines, the methodology for X-ray area detector characterization is reviewed. It is based on the definition of a minimum yet complete set of imaging parameters able to describe any kind of two-dimensional detector regardless of its operating range, field of application and detecting principle. Measuring and derivation methods are reviewed for each parameter. Imaging parameters are to a large extent directly exploitable to assess the performance of a detector for any scientific application. Imaging characterization aims at helping two-dimensional detector developers and two-dimensional detector users in defining or choosing the device best suited for a given application, based on quantitative arguments. © 2006 International Union of Crystallography. Printed in Great Britain - All rights reserved.