An analysis of defects induced by high dose γ-ray irradiation and their influence on the charge transport properties in CdZnTe detectors

13Citations
Citations of this article
15Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Radiation damage effects were important issues for the development of CdZnTe detectors in space-exploration field applications. In this study, we explored the radiation damage mechanisms on CdZnTe crystals based on the Kinchin-Pease model. The type and evolution of irradiation induced defects under different gamma ray doses were investigated by the photoluminescent technique. Laser beam induced transient current measurement was applied to investigate the influence of defects on the charge transport property. Our results demonstrated that the radiation induced defects accumulated negative space charges, which significantly distorted the electric field distribution and reduced electron mobility by enhancing the ionized impurities scattering effect. By correlating the results with 241Am gamma ray radiation response spectra measurement, the effects of radiation damage on the detector performance were discussed.

Cite

CITATION STYLE

APA

Guo, R., Xu, Y., Wang, T., Zha, G., & Jie, W. (2020). An analysis of defects induced by high dose γ-ray irradiation and their influence on the charge transport properties in CdZnTe detectors. Journal of Applied Physics, 127(2). https://doi.org/10.1063/1.5126792

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free