In-process measurement of a keyhole using a low-coherence interferometer with a high repetition rate

  • Hayashi N
  • Hoshikawa M
  • Ishii K
  • et al.
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Abstract

The shape of an instance hole (keyhole) created via a high-power laser was measured using a low-coherence interferometer with the following parameters: repetition rate, 10 MHz; center wavelength, 1550 nm; absolute spatial resolution, 10 µm; and measurement range, 5 mm. The keyhole was created on a 3-mm-thick stainless-steel plate using a high-power laser with 8-kW peak power and 1070-nm center wavelength. The cross-sectional area of the keyhole was measured to be 0.42 mm × 0.78 mm (width × depth) using the interferometer, and its side dimension was 0.46 mm × 0.78 mm (width × depth).

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Hayashi, N., Hoshikawa, M., Ishii, K., Fujita, T., Kanamori, M., Deguchi, T., … Wada, N. (2021). In-process measurement of a keyhole using a low-coherence interferometer with a high repetition rate. Optics Express, 29(20), 32169. https://doi.org/10.1364/oe.435139

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