Journal Article

Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories

IEEE Transactions on Computers (1980) C-29(6) 419-429
DOI: 10.1109/TC.1980.1675601
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Abstract

A class of pattern-sensitive faults in semiconductor random-access memories are studied. Efficient test procedures to detect and locate modeled faults are presented. Copyright © 1980 by The Institute of Electrical and Electronics Engineers, Inc.

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Suk, D. S., & Reddy, S. M. (1980). Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories. IEEE Transactions on Computers, C–29(6), 419–429. https://doi.org/10.1109/TC.1980.1675601

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