New opportunities for anomalous small-angle x-ray scattering to characterize charged soft matter systems

21Citations
Citations of this article
23Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

This article presents a quantitative analysis of charged Soft Matter system using Anomalous Small-Angle X-Ray Scattering (ASAXS). Specific experimental requirements and data reduction are described. The simultaneous analysis of data sets recorded below and above the absorption edge provides valuable constraints in data modelling. The merit of the method is illustrated by an example involving cationic surfactant micelles. The counterion profile around the micelle is deduced in a self-consistent manner and the results reveal the strong condensation of counterions on to the micellar surface. © Published under licence by IOP Publishing Ltd.

Cite

CITATION STYLE

APA

Sztucki, M., Di Cola, E., Narayanan, T., Sztucki, M., Cola, E. D., & Narayanan, T. (2011). New opportunities for anomalous small-angle x-ray scattering to characterize charged soft matter systems. In Journal of Physics: Conference Series (Vol. 272). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/272/1/012004

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free