Input-aware statistical timing analysis-based delay test pattern generation

Abstract

Delay test pattern generation has emerged as an increasingly critical problem in high performance VLSI designs. Existing techniques find timing critical paths by STA or SSTA, apply a traditional ATPG algorithm subsequently and find the test patterns. In this paper, we propose a new delay test pattern generation method, which finds timing critical paths by more accurate input-aware statistical timing analysis, achieves input patterns by back-tracing, and verifies the estimated timing critical paths under the input patterns by logic simulation. Our experimental results based on 9 ISCAS'89 benchmark circuits show that the state-of-the-art SSTA-TQM-BnB technique achieves an average of 57.83%, 54.50%, and 69.91% delay fault coverage, while our SPSTA-DTPG technique achieves an average of 67.83%, 71.39%, and 77.53% delay fault coverage for a test size of 50, 100, and 200, respectively. © 2013 IEEE.