Electrooptic Sensor for Near-Field Measurement

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Abstract

This paper presents a novel electric field measurement system utilizing optical technology, which has been developed, tested, and calibrated for the near-field measurement in the frequency range up to 1.8 GHz. The measuring probe is passive, all-dielectric, electromagnetic interference (EMI)-immune, and provides the information on the field strength, frequency, and phase. The achieved measurement resolution and minimum measurable fields were 10 V/m, with a spatial resolution of 10 mm. A finite-difference time-domain (FDTD) algorithm for solving Maxwell's equation was used to assess the field perturbation by the presence of the measuring probe and the suitability for the near-field measurement. © 1999 IEEE.

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Cecelja, F., & Balachandran, W. (1999). Electrooptic Sensor for Near-Field Measurement. IEEE Transactions on Instrumentation and Measurement, 48(2), 650–653. https://doi.org/10.1109/19.769679

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