Abstract
In this paper the new method of gain non-uniformity correction of microbolometer detectors is presented. The principle of this method is based on using an additional source of infrared radiation, which provides the excitation to the detector in parallel with the radiation of observed scene. The response of the detector to the excitation is calculated using frequency analysis, and it contains the information about the detector's gain non-uniformity. This method enables a thermal camera to perform a live gain correction without using a shutter.
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Olbrycht, R., Wiȩcek, B., & Świa̧tczak, T. (2010). Shutterless method for gain nonuniformity correction of microbolometer detectors. Przeglad Elektrotechniczny, 86(11 A), 120–122.
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