Improving the dimensional accuracy of computed tomography data obtained with high-resolution 3D X-ray microscopes

Abstract

Today, 3D X-ray microscopes (XRMs) have the unique ability to achieve higher resolution, non-destructive imaging, within larger parts than traditional X-ray micro computed tomography (CT) systems. Such unique capability is, more and more, of interest to industrial quality control entities as they grapple with small features in precision manufactured parts for various industries such as automotive, electronics, aerospace, medical devices, and additive manufacturing, to name a few examples.