Diffraction gratings as small-angle X-ray scattering calibration standards

Abstract

It is shown that diffraction gratings can be used as accurate momentum-transfer calibration standards in small-angle X-ray scattering experiments. For demonstration purposes, a silicon diffraction grating with a period of 400 nm is used. The data exhibit 50 diffraction peaks evenly distributed in the momentum-transfer range q = 0.0-0.8 nm-1, a regime that is not accessible using the traditional silver behenate standard. © 2010 International Union of Crystallography. Printed in Singapore-all rights reserved.