Abstract
A new NAND-type nonvolatile memory with a field-enhancing tip structure embedded in low-temperature polycrystalline silicon (LTPS) panel was demonstrated on a glass substrate for the first time. A thin-film transistor (TFT) metal-oxide-nitride-oxide-silicon (MONOS) device based on sequential lateral solidification crystallization with a fully depleted poly-Si channel, an oxide-nitride-oxide stack gate dielectric, and a metal gate is integrated into a NAND array. A NAND test array based on p-channel LTPS TFTs exhibits good cycling endurance and data retention properties and negligible program and read disturbance. These results strongly support the claim that this TFT-MONOS device is a promising candidate for use in embedded nonvolatile memory for system-on-panel and 3-D IC applications. © 2007 IEEE.
Author supplied keywords
Cite
CITATION STYLE
Chen, H. T., Hsieh, S. I., Lin, C. J., & King, Y. C. (2007). Embedded TFT NAND-type nonvolatile memory in panel. IEEE Electron Device Letters, 28(6), 499–501. https://doi.org/10.1109/LED.2007.896894
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.