Modern phase shifting interferometers enable the manufacture of optical systems that drive the global economy. Semiconductor chips, solid-state cameras, cell phone cameras, infrared imaging systems, spacebased satellite imaging, and DVD and Blu-Ray disks are all enabled by phase-shifting interferometers. Theoretical treatments of data analysis and instrument design advance the technology but often are not helpful toward the practical use of interferometers. An understanding of the parameters that drive the system performance is critical to produce useful results. Any interferometer will produce a data map and results; this paper, in three parts, reviews some of the key issues to minimize error sources in that data and provide a valid measurement.
CITATION STYLE
Smythe, R. A. (2012). Practical aspects of modern interferometry for optical manufacturing quality control, Part 3. Advanced Optical Technologies, 1(4), 335–342. https://doi.org/10.1515/aot-2012-0031
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