Reference-free X-ray fluorescence analysis using well-known polychromatic synchrotron radiation

Abstract

A reliable X-ray fluorescence (XRF) analysis can be achieved by using accurate knowledge of the spectral distribution of the excitation source. Since most commonly employed X-ray sources emit broadband polychromatic radiation, it is essential to fully characterize the source in order to calculate its spectrum under varying operational settings. By using the calculable synchrotron radiation from a bending magnet, this work shows that a reference-free XRF approach can be implemented for polychromatic excitation conditions. It is further demonstrated that this physically traceable approach is capable of quantifying thin layers as well as stratified materials. The same principles may readily be transferred to similar polychromatic X-ray sources, such as XRF instruments based on an X-ray tube.