Abstract
In the present study, we report on dispersion function over a spectral range of 300-1700 nm (i.e. 0.73-4.13eV) for CVD-grown full area coverage monolayer WS2 and WSe2 films on SiO2/Si substrates. The result is obtained via the analysis of spectroscopic ellipsometry spectra by virtue of Tauc-Lorentz oscillators, which takes into account that absorption of these materials are attributed to the formation of the excitons.
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CITATION STYLE
Ermolaev, G. A., Yakubovsky, D. I., Stebunov, Y. V., Voronov, A. A., Arsenin, A. V., & Volkov, V. S. (2021). Spectroscopic ellipsometry of large area monolayer WS2and WSe2films. In AIP Conference Proceedings (Vol. 2359). American Institute of Physics Inc. https://doi.org/10.1063/5.0054947
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