Abstract
Picosecond transient grating spectroscopy is applied to research on the dynamics of excited carriers in amorphous semiconductors. Using this technique, the dynamics of the photodarkening process in As//2S//3 chalcogenide glass, as well as the carrier dynamics in optically illuminated glow discharge a-Si: H, are clarified. The observed dynamic behavior of the photodarkening process is such that excited carriers diffuse in mobile states and relax to a photodarkening state through localized states near the midgap. In optically illuminated a-Si: H, a picosecond rapid relaxation is found. This is explained by the multiple trapping mechanism, taking account of shallow and deep localized states, which increase after optical illumination.
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CITATION STYLE
Aoyagi, Y., Segawa, Y., & Okamoto, H. (1983). PICOSECOND SPECTROSCOPY. Japan Annual Reviews in Electronics, Computers & Telecommunications (Vol. 6, pp. 124–134). OHMSHA Ltd. https://doi.org/10.2184/lsj.11.492
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