Compton imaging tomography for one-sided access NDE of nuclear power plant structures, systems, and components

Abstract

Novel nondestructive evaluation (NDE) systems based on a recently pioneered Compton Imaging Tomography (CIT) technique are currently being developed by Physical Optics Corporation (POC). CIT provides high-resolution three-dimensional Compton scattered X-ray imaging of the internal structure of evaluated objects, using a set of acquired two-dimensional Compton scattered X-ray images of consecutive cross sections of these objects. Unlike conventional computed tomography, CIT requires only one-sided access to objects, has no limitation on the dimensions and geometry of the objects, and can be applied to large multilayer nonuniform objects with complicated geometries. Also, CIT does not require any contact with the objects being imaged during its application.