IR filtering properties of TiAlN/Cu/TiAlN coatings

Abstract

In this paper, to explore the potential infrared filtering applications of magnetron sputtered TiAlN/Cu/TiAlN coatings, we investigated the optical, morphological and surface topographical properties using UV/Vis/NIR spectrometry, Scanning Electron Microscopy (SEM) and Atomic Force Microscopy, respectively. From IR Spectroscopy analysis, it is observed that glass/TiAlN/Cu/TiAlN structure with 10 nm thick Cu layer showed highest visible transmittance of 78% and lowest IR transmittance of 22% at 600 nm and 2500 nm wavelength, respectively. In additon the AFM topographs further indicate that the inner TiAlN seeding layer could reduce the average roughness of Cu layer to 3 nm as compared to 8 nm without seeding layer. Moreover, outer TiAlN layer demonstrates very good environmental and corrosion protection property. Based on the results and analysis, it is proposed that TiAlN/Cu/TiAlN can be used as an efficient IR reflective material with high visible transmittance.