Electron Microscopy for Visualization of Interfaces in Adhesion and Adhesive Bonding

Abstract

This chapter provides an overview of electron microscopy techniques to investigate interfaces in polymeric materials and adhesive bonds. First, how the instruments of energy-filtering transmission electron microscopy (EFTEM), scanning transmission electron microscopy (STEM), and scanning electron microscopy (SEM) work and are operated is briefly described. The principles of electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectrometry (EDX), which are spectroscopic techniques associated with these instruments, are described. Next, the specimen preparation techniques, such as ultramicrotomy, heavy metal staining, focused ion beam (FIB) fabrications, and replica method, which are essential for these electron microscopy tasks, are introduced. This chapter also reviews advanced electron microscopy techniques, such as STEM-EDX-tomography, chemical phase mapping using electron energy-loss near-edge structure (ELNES), and in situ tensile TEM. Numerous examples of the application of these techniques to various surfaces and interfaces present in polymer alloys and composites, crystalline polymers, adhesive bonds, and metal substrate surfaces are presented.