Experimental comparison between the conversion electron yield and X-ray fluorescence in catalyst analysis

Abstract

To evaluate the application of the conversion-electron-yield (CEY) method in catalyst analysis, the intensities of the CEY and X-ray fluorescence (XRF) as a function of glancing angle were measured simultaneously. The probing depth of the CEY method is shallower than that of the XRF method. The CEY method also shows potential application for the analysis of even a powder specimen of a low-concentration zeolite catalyst.