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Linewidth broadening factor of a microcavity semiconductor laser

Applied Physics Letters (1992) 61(16) 1883-1885
DOI: 10.1063/1.108377
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Abstract

The emission linewidth above threshold is measured in a GaAs/AlGaAs microcavity surface-emitting laser with a single cavity mode. The measured linewidth broadening factor is in good agreement with theoretical calculations that include the most important many-body Coulomb effects of the electron-hole plasma.

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Jin, R., Boggavarapu, D., Khitrova, G., Gibbs, H. M., Hu, Y. Z., Koch, S. W., & Peyghambarian, N. (1992). Linewidth broadening factor of a microcavity semiconductor laser. Applied Physics Letters, 61(16), 1883–1885. https://doi.org/10.1063/1.108377

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