Prospects and challenges of cathodoluminescence imaging in solid-state devices: A brief review

Abstract

The prospect of cathodoluminescence (CL) imaging is evident in its multi-versatile application. For almost three decades, the use of CL imaging in solid-state research has evolved into a reliable characterization tool. In this paper, a chronological review on the theoretical dynamics of CL on semiconductor and nanoscale materials was presented. It was concluded that the optimization of the CL imaging process depends on the microstructural abnormally of the sample.