Effective surface passivation of crystalline silicon by rf sputtered aluminum oxide

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Abstract

In recent years, excellent surface passivation has been achieved on both p-type and n-type surfaces of silicon wafers and solar cells using aluminum oxide deposited by plasmaassisted atomic layer deposition. However, alternative deposition methods may offer practical advantages for large-scale manufacturing of solar cells. In this letter we show that radiofrequency magnetron sputtering is capable of depositing negatively-charged aluminum oxide and achieving good surface passivation both on p-type and n-type silicon wafers. We thus establish that sputtered aluminum oxide is a very promising method for the surface passivation of high efficiency solar cells. © 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

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Li, T. T., & Cuevas, A. (2009). Effective surface passivation of crystalline silicon by rf sputtered aluminum oxide. Physica Status Solidi - Rapid Research Letters, 3(5), 160–162. https://doi.org/10.1002/pssr.200903140

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