Abstract
Sb- and Nb-doped tin oxides have been prepared by a co-precipitation method. Whilst X-ray powder diffraction and EDX mapping indicate similar dopant distributions, more detailed characterisation by variable high-temperature XRD, 119Sn MAS NMR and Nb K-edge X-ray absorption near edge structure spectroscopy reveal clear differences in the oxide structures. This detailed structural information is used to validate the measured differences in electrical conductivity.
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CITATION STYLE
Oakton, E., Tillier, J., Siddiqi, G., Mickovic, Z., Sereda, O., Fedorov, A., & Copéret, C. (2016). Structural differences between Sb- and Nb-doped tin oxides and consequences for electrical conductivity. New Journal of Chemistry, 40(3), 2655–2660. https://doi.org/10.1039/c5nj03182f
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