Ga2Se3Defect Semiconductors: The Study of Direct Band Edge and Optical Properties

Abstract

Direct band edge is a crucial factor for a functional chalcogenide to be applied in luminescence devices, photodetectors, and solar-energy devices. In this work, the room-temperature band-edge emission of III-VI Ga2Se3 has been first observed by micro-photoluminescence (μPL) measurement. The emission peak is at 1.85 eV, which matches well with the band-edge transition that is measured by micro-thermoreflectance (μTR) and micro-transmittance (μTransmittance) for verification of the direct band edge of Ga2Se3. The temperature-dependent μTR spectra of Ga2Se3 show a general semiconductor behavior with its temperature-energy shift following Varshni-type variation. With the well-evident direct band edge, the peak responsivities of photovoltaic response (â6.2 mV/μW) and photocurrent (â2.25 μA/μW at f = 30 Hz) of defect zincblende Ga2Se3 can be, respectively, detected at â2.22 and â1.92 eV from a Cu/Ga2Se3 Schottky solar cell and a Ga2Se3 photoconductor. On the basis of experimental analysis, the optical band edge and photoresponsivity properties of a III-VI Ga2Se3 defect semiconductor are thus realized.