Scanning Hall probe microscopy

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Abstract

We describe the implementation of a scanning Hall probe microscope of outstanding magnetic field sensitivity (∼0.1 G) and unprecedented spatial resolution (∼0.35 μm) to detect surface magnetic fields at close proximity to a sample. Our microscope combines the advantages of a submicron Hall probe fabricated on a GaAs/Al0.3Ga0.7As heterostructure chip and the scanning tunneling microscopy technique for precise positioning. We demonstrate its usefulness by imaging individual vortices in high Tc La1.85Sr0.15CuO4 films and superconducting networks, and magnetic bubble domains.

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Chang, A. M., Hallen, H. D., Harriott, L., Hess, H. F., Kao, H. L., Kwo, J., … Chang, T. Y. (1992). Scanning Hall probe microscopy. Applied Physics Letters, 61(16), 1974–1976. https://doi.org/10.1063/1.108334

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