The Debye-Scherrer technique - Rapid detection for applications

Abstract

The Debye-Scherrer (DS) technique is a common technique for determining spacings in atomic layers by X-ray diffraction. The spacings of the atomic layers are proportional to the macroscopic stress in the radiated area. When a crystalline powder is irradiated with X-rays, the diffracted X-rays produce a ring that photographic films detect. Afterward, the film is developed to reveal the rings. Earlier, this procedure took lots of time. With upcoming multiple wavelength anomalous dispersion-detectors, a very sensitive area detector, DS rings can be detected and analyzed in minutes. This allows for the rapid determination of residual stresses prior to inspection in a production environment. Additional information from the intensity distribution within the ring can be obtained. A description of the new technique is given.