Static stress triggering explains the empirical aftershock distance decay

24Citations
Citations of this article
33Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

The shape of the spatial aftershock decay is sensitive to the triggering mechanism and thus particularly useful for discriminating between static and dynamic stress triggering. For California seismicity, it has been recently recognized that its form is more complicated than typically assumed consisting of three different regimes with transitions at the scale of the rupture length and the thickness of the crust. The intermediate distance range is characterized by a relative small decay exponent of 1.35 previously declared to relate to dynamic stress triggering. We perform comprehensive simulations of a simple clock-advance model, in which the number of aftershocks is just proportional to the Coulomb-stress change, to test whether the empirical result can be explained by static stress triggering. Similarly to the observations, the results show three scaling regimes. For simulations adapted to the depths and focal mechanisms observed in California, we find a remarkable agreement with the observation over the whole distance range for a fault distribution with fractal dimension of 1.8, which is shown to be in good agreement with an independent analysis of California seismicity. Key Points We perform static stress calculations adapted to Southern CaliforniaThe depth distribution and surface effects are importantStatic stress triggering explains the empirical decay with three scaling regimes

Cite

CITATION STYLE

APA

Hainzl, S., Moradpour, J., & Davidsen, J. (2014). Static stress triggering explains the empirical aftershock distance decay. Geophysical Research Letters, 41(24), 8818–8824. https://doi.org/10.1002/2014GL061975

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free