THERMAL-INDUCED DAMAGE ON SOLDER JOINTS OF HIGH-DENSITY ADJACENT BALL GRID ARRAY COMPONENTS DURING THE REWORK PROCESS

Abstract

Correlation between adjacent ball grid array (BGA) components' temperature and thermal-induced damage to their solder joints on both the top and bottom printed circuit board assembly (PCBA) sides during the rework process is studied in this work. Total often adjacent BGA components from the rework area on the top (F-K) and bottom (A-E) PCBA side were observed. The dye and pull (D&P) test results, infrared thermography images, and temperature measurements were analyzed for solder joint crack induced by the thermal damage with precise temperature measurement on each adjacent BGA component. Scanning electron microscope (SEM) analysis complemented the post-D&P test solder joint crack observation. The D&P test results shows that 76 % or higher and solder joint separation locations at the copper pad on BGA occurred when the temperature of the adjacent components of the rework location exceeded 195 °C and 210 °C on the centre and corner of the component, respectively.