Growth and Study of Multilayer Cd1-xMgxO Thin Films Deposited by Thermal Evaporation

Abstract

Multilayer thin films of Cd1-xMgxO (CdMgO) were fabricated with various concentration of Magnesium by simple thermal evaporation technique. The deposited films were vacuum annealed at 400 °C temperature and optical, structural and electrical properties were investigated. The XRD analysis exhibited the polycrystalline nature with prominent peak along (111) plane. The SEM micrograph specified that with increasing Mg content into the films the grain size decreased. The existence of Mg content was confirmed by EDAX. The transmittance of the films was remarkably increased after vacuum annealing, a perspective for the fabrication of solar cells and other optoelectronic devices. The enhancement and blue shift of band gap indicated that CdMgO alloy could be useful for photovoltaic and optoelectronic devices. The electric resistivity increased from 535 ω cm for CdO to 1.2 × 105 ωcm for CdMgO films with the increase of Mg concentration.