Abstract
The interfacial stresses in, and the curvature of, an elongated trimaterial assembly, subjected to the change in temperature, are predicted based on an approximate structural analysis (strength-of-materials) model. The obtained results can be helpful in stress-strain evaluations and physical design of trimaterial assemblies in microelectronic and photonic packaging. © 2001 American Institute of Physics.
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CITATION STYLE
APA
Suhir, E. (2001). Analysis of interfacial thermal stresses in a trimaterial assembly. Journal of Applied Physics, 89(7), 3685–3694. https://doi.org/10.1063/1.1350623
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