Threshold reduction of 1.3 µm GaInAsP/InP surface emitting laser by a maskless circular planar buried heterostructure regrowth

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Abstract

A newly introduced maskless planar buried heterostructure regrowth has substantially improved the regrown heterointerface of a 1.3µm GaInAsP/InP circular buried heterostructure surface emitting laser. The threshold current of the 12 µmø device was reduced to 2.2 mA at 77 K under CW conditions. © 1993, The Institution of Electrical Engineers. All rights reserved.

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Baba, T., Suzuki, K., Yogo, Y., Iga, K., & Koyama, F. (1993). Threshold reduction of 1.3 µm GaInAsP/InP surface emitting laser by a maskless circular planar buried heterostructure regrowth. Electronics Letters, 29(4), 331–332. https://doi.org/10.1049/el:19930224

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