Abstract
A new type of true random number generator, based on the random telegraph noise of a contact-resistive random access memory device, is proposed in this letter. The random-number generator consists of only a simple bias circuit plus a comparator, leading to small circuit area and low power consumption. By realizing this generator by the 65-nm complementary metal-oxide-semiconductor logic process, the occupied area can be as low as 45 mu;m 2, demonstrating substantial saving in the circuit area. © 2012 IEEE.
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CITATION STYLE
Huang, C. Y., Shen, W. C., Tseng, Y. H., King, Y. C., & Lin, C. J. (2012). A contact-resistive random-access-memory-based true random number generator. IEEE Electron Device Letters, 33(8), 1108–1110. https://doi.org/10.1109/LED.2012.2199734
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