Raman Spectroscopy of V4 O7 Films

Abstract

A thin film of vanadium oxide Magnéli phase V4 O7 was produced using cathodic arc sputtering. X-ray diffraction, Rutherford backscattering spectrometry and Raman investigations confirmed the formation of this phase. The Raman spectrum of V4 O7 differs considerably from the spectrum of another Magnéli oxide, V3 O5, showing that Raman spectroscopy is an excellent tool for distinguishing between these two phases. Temperature-dependent Raman measurements revealed a significant change of the spectra near the V4 O7 metal–insulator phase transition.