Reliability Prediction Methods for Electronic Devices and SystemsA Review

Abstract

Reliability analysis of the electronic devices, subsystems and complex systems is the most important requirement of today's competitive era. To mitigate the premature failures, to improve the performance and the longer life of these components and systems The knowledge of root causes of failures of these devices and systems enables to obtain high product reliability. To address these reliability issues a wide range of reliability prediction methods are available for electronic systems. In this article various reliability prediction methods are discussed with their concepts of application, advantages and disadvantages also. On the basis of this comparative study recommendations can be made to use the respective methods to achieve the high reliability goals.