Nondestructive two-dimensional phase imaging of embedded defects via on-chip spintronic sensor

Abstract

A microwave near field phase imaging technique has been achieved by an on-chip spintronic sensor. The sensor directly rectifies a microwave field into a dc voltage signal by employing the spintronic principle, in which the relative phase between microwave electric and magnetic fields plays an important role. By manipulating the relative phase, the sensor can nondestructively detect embedded defects of subwavelength size. © 2012 American Institute of Physics.