Phonon dispersion curves in wurtzite-structure GaN determined by inelastic X-ray scattering

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Abstract

Inelastic X-ray scattering techniques were used to determine the lattice dynamics of wurtzite-gallium nitride single crystals. Phonon dispersion curves were also calculated with special references to Ab initio methods. Correctness of eigenvectors was proved as the analysis was found in agreement with the phonon energies and scattering intensities.

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Ruf, T., Serrano, J., Cardona, M., Pavone, P., Pabst, M., Krisch, M., … Leszczynski, M. (2001). Phonon dispersion curves in wurtzite-structure GaN determined by inelastic X-ray scattering. Physical Review Letters, 86(5), 906–909. https://doi.org/10.1103/PhysRevLett.86.906

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