Self-bearing membrane exit window with the separate anode for sub-microsecond electron accelerator: Exit window for sub-microsecond e-accelerator

Abstract

A vacuum electron diode of a sub-microsecond pulsed electron accelerator with various cooled air-water exit window designs were tested in single-pulse and high-repetition-rate modes. A well-known exit window construction with metal membrane and supporting grid was tested for 104 electron beam pulses at 10 pps before crashing with vacuum failure. A design with a self-bearing anode-membrane demonstrated 105 pulses durability without vacuum failure at 40 pps but accumulated damage like foil sag, overheating areas and surface discharge marks. The combined design of an exit window with an anode-grid and a self-bearing membrane demonstrated a lifetime of more than 106 beam pulses at 40 pps operation.