Abstract
We report on the evolution of the structure and composition of a Pt(3 nm)/Co(0.6 nm)/AlOx(2 nm) trilayer sputtered on Si/SiO2 under oxidation and annealing processes by combined x-ray reflectivity and x-ray absorption studies. We describe the progressive and inhomogeneous oxidation of the layers by increasing the oxidation time. Before annealing, the layers have lower density than bulk samples and noticeable roughness. After thermal annealing, a significant improvement of the quality of the alumina layer goes along with the formation of a CoPt alloy that reduces the number of Co-O bonds. These structural outcomes clarify the evolution of the magnetic and transport properties reported at room temperature in these samples. © 2013 AIP Publishing LLC.
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CITATION STYLE
Garad, H., Ortega, L., Ramos, A. Y., Joly, Y., Fettar, F., Auffret, S., … Erko, A. I. (2013). Competition between CoOx and CoPt phases in Pt/Co/AlO x semi tunnel junctions. Journal of Applied Physics, 114(5). https://doi.org/10.1063/1.4816620
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