Grain growth mechanism of lamellar-structure high-purity nickel via cold rolling and cryorolling during annealing

Abstract

High-purity (99.999%) nickel with lamellar-structure grains (LG) was obtained by room-temperature rolling and cryorolling in this research, and then annealed at different temperatures (75◦C, 160◦C, and 245◦C). The microstructure was characterized by transmission electron mi-croscopy. The grain growth mechanism during annealing of the LG materials obtained via different processes was studied. Results showed that the LG high-purity nickel obtained by room-temperature rolling had a static discontinuous recrystallization during annealing, whereas that obtained by cry-orolling underwent static and continuous recrystallization during annealing, which was caused by the seriously inhibited dislocation recovery in the rolling process under cryogenic conditions, leading to more accumulated deformation energy storage in sheets.