Sub-pixel dimensional measurement algorithm based on intensity integration threshold

Abstract

In this paper, we proposed a sub-pixel measurement algorithm based on intensity integration threshold (IIT). The proposed method can localize the sub-pixel edges in an inexpensive way by calculating the integration of the intensity across the edge and finding the point where the integration reaches the threshold. Comparative tests show our method realized better efficiency and robustness in practical applications than other state-of-the-art algorithms.